Korean J. Met. Mater. 2016;54(9):711-715. Published online 2016 Sep 5
DOI:
https://doi.org/10.3365/KJMM.2016.54.9.711
Abstract
Micro-twinning has been investigated in some state-of-the-art materials by transmission electron microscopy, but such characterizations have not been clear so far. Micro-twins must be characterized by identifying their spots in the electron diffraction pattern, which is very unique compared to normal defects such as dislocations or stacking.....
More