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Effects of Au Bump Process Condition on the Interfacial Reaction and Mechanical Reliability of Non-cyanide Au Bump for Display Driver IC Bonding
디스플레이 구동 칩 접합을 위한 시안화물이 포함되지 않은 Au 범프 공정 조건이 계면 반응 및 기계적 신뢰성에 미치는 영향
Hyejin Kim, Gahui Kim, Yong-Ho Ko, Chul-min Baek, Joo-Hyeon Park, Young-Bae Park
김혜진, 김가희, 고용호, 백철민, 박주현, 박영배
Korean J. Met. Mater. 2024;62(9):726-734.   Published online 2024 Sep 5
DOI: https://doi.org/10.3365/KJMM.2024.62.9.726

Abstract
The effects of annealing temperature and thermal cycle conditions on the adhesion characteristics of non-cyanide Si/sputter TiW/sputter Au/Au bump structure were systematically investigated using a shear test. No intermetallic compound was observed at the TiW/Au interface at all annealing temperatures, and voids formed between the TiW and Au bump interface..... More

                
Effects of Heat Treatment and Thermal Cycle Conditions on the Bonding Strength and Interfacial Characteristics of Electroplated Cr/Electroplated Ni-P Coatings
열처리 및 열 사이클 조건에 따른 전해 Cr/전해 Ni-P 도금의 접합강도 평가 및 계면분석
Jina Lee, Kirak Son, Myung-Hee Choi, Kyu Hwan Lee, Young-Bae Park
이진아, 손기락, 최명희, 이규환, 박영배
Korean J. Met. Mater. 2018;56(4):280-288.   Published online 2018 Apr 5
DOI: https://doi.org/10.3365/KJMM.2018.56.4.280

Abstract
The effects of heat treatment and thermal cycle conditions on the bonding strength and interfacial characteristics of electroplated Cr/electroplated Ni-P coatings were systematically evaluated. With step1 samples, heat treatment was performed at 750 oC for 6 hours after successive electroplating of Ni-P and Cr layers. With step2 samples, 1st heat..... More

    
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