Bridge Burst Characteristics of Aluminum and Copper Thin-Film Bridges in Electrical Initiation Devices
Kyoungjin Kim, Kyu-Hyoung Kim, Seung-gyo Jang
Korean J. Met. Mater.. 2018;56(3):235-243.   Published online 2018 Mar 6     DOI: https://doi.org/10.3365/KJMM.2018.56.3.235
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