 |
|
Influence of the Thickness of TiO2/TiO2-x Layers on the Behavior of a Memristor Device
Han-Sang Kim, Sung-Jin Kim
Korean J. Met. Mater.. 2019;57(2):84-90. Published online 2019 Feb 5 DOI: https://doi.org/10.3365/KJMM.2019.57.2.84
|
|
Citations to this article as recorded by
 Simulation Study of Interfacial Switching Memristor Structure and Neural Network Performance
Yun Hyeok Song, Ji Min Lim, Sagar Khot, Dongmyung Jung, Yongwoo Kwon
Korean Journal of Metals and Materials.2024; 62(3): 212. CrossRef Memristor based on carbon nanotube gelatin composite film as artificial optoelectronic synapse for image processing
Yanmei Sun, Bingxun Li, Ming Liu, Zekai Zhang
Journal of Colloid and Interface Science.2024; 676: 249. CrossRef Electron Irradiation Effects on the Optical and Electrical Properties of ZnO/Ag/SnO2 Thin Films
Yu-Sung Kim, Jin-Young Choi, Yun-je park, Su-Hyeon Choe, Byung-Chul Cha, Young-Min Kong, Daeil Kim
Korean Journal of Metals and Materials.2020; 58(3): 190. CrossRef Enhanced Optical and Electrical Properties of Ti Doped In2O3 thin Films Treated by Post-deposition Electron Beam Irradiation
Su-Hyeon Choe, Yun-Je Park, Yu-Sung Kim, Byung-Chul Cha, Sung-Bo Heo, Sungook Yoon, Young-Min Kong, Daeil Kim
Korean Journal of Metals and Materials.2020; 58(11): 793. CrossRef Influence of Film Thickness on the Electrical and Optical Properties of ZnO/Ag/SnO2 Tri-Layer Films
Yu-Sung Kim, Jin-Young Choi, Yun-Je Park, Su-Hyeon Choe, Young-Min Kong, Daeil Kim
Korean Journal of Metals and Materials.2019; 57(5): 324. CrossRef Effects of Rapid Thermal Annealing on the Structural, Optical, and Electrical Properties of ZnO/Ag/SnO2 Tri-Layer Films
Su-Hyeon Choe, Yu-Sung Kim, Jin-Young Choi, Yun-Je Park, Byung-Chul Cha, Young-Min Kong, Daeil Kim
Korean Journal of Metals and Materials.2019; 57(8): 506. CrossRef
|