Influence of Film Thickness on the Electrical and Optical Properties of ZnO/Ag/SnO2 Tri-Layer Films
Yu-Sung Kim, Jin-Young Choi, Yun-Je Park, Su-Hyeon Choe, Young-Min Kong, Daeil Kim
Korean J. Met. Mater.. 2019;57(5):324-327. Published online 2019 May 5 DOI: https://doi.org/10.3365/KJMM.2019.57.5.324
|
Citations to this article as recorded by
Enhancement of TOC removal efficiency of sulfamethoxazole using catalysts in the radiation treatment: Effects of band structure and electrical properties of radiocatalysts
Kang Lee, Tae-Hun Kim, Tak-Hyun Kim, Jaesang Lee, Seungho Yu
Separation and Purification Technology.2023; 312: 123390. CrossRef Effect of Co-Solvent Percentages on the Exfoliation Rate of NiTe2 Thin Film for Transparent Electrodes
Jun Ho Lee, Ho Jun Park, Chae Eun Im, Jong Gyeom Kim, Dong Eun Gu, Suk Jun Kim
Korean Journal of Metals and Materials.2021; 59(7): 481. CrossRef Influence of Ag interlayer Thickness on the Optical, Electrical and Mechanical Properties of Ti-doped In2O3/Ag/Ti-doped In2O3 Multilayer Flexible Transparent Conductive Electrode
Su-Hyeon Choe, Jin-Kyu Jang, Hyun-Jin Kim, Jae-Wook Choi, Sung-Bo Heo, Yu-Sung Kim, Young-Min Kong, Daeil Kim
Korean Journal of Metals and Materials.2021; 59(8): 545. CrossRef A Study on the ZnO Thin Film Deposited by RF Sputtering Method as an Electron Transport Layer in Quantum Dot Light-Emitting Diodes
Myoungsuk Kang, Jiwan Kim
Korean Journal of Metals and Materials.2021; 59(10): 718. CrossRef A Study on the ZnO Thin Film Deposited by RF Sputtering Method as an Electron Transport Layer in Quantum Dot Light-Emitting Diodes
Myoungsuk Kang, Jiwan Kim
Korean Journal of Metals and Materials.2021; 59(10): 718. CrossRef Effect of Sintering Temperature on the Characteristics of Zn0.99Li0.01O Thin Film on Si Substrate
Gang Bae Kim, June Won Hyun
Korean Journal of Metals and Materials.2020; 58(4): 257. CrossRef Facile Synthesis of ZnO Thin Films at Low Temperatures Using an Additive-Free Electrochemical Oxidation Method
Euije Jo, Dongwan Kim, Jae-Young Leem
Korean Journal of Metals and Materials.2020; 58(9): 645. CrossRef
|