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Calculated Electric Transport Properties of Thermoelectric Semiconductors Under Different Carrier Scattering Mechanisms
Sang-il Kim, Hyun-Sik Kim
Korean J. Met. Mater.. ;59(2):127-134. Published online 2021 Jan 27 DOI: https://doi.org/10.3365/KJMM.2021.59.2.127
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Citations to this article as recorded by
 Approaches to Estimate the Magnitude of Phonon Scattering via Point Defects in Mo(Se1-xTex)2 Thermoelectric Alloys
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Korean Journal of Metals and Materials.2023; 61(1): 38. CrossRef Electronic Transport Properties of Bi2Te2.7Se0.3 Fabricated by Hot Extrusion
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Korean Journal of Metals and Materials.2023; 61(3): 198. CrossRef Study of Phase Formation Behavior and Electronic Transport Properties in the FeSe2 -FeTe2 System
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Korean Journal of Metals and Materials.2022; 60(4): 315. CrossRef
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