Effect of E-Beams Irradiation Dose on the Sensing Properties of Pt-Functionalized Reduced Graphene Oxides Following Annealing of the 6 nm-Thick Pt Layer |
Yong Jung Kwon1, Ali Mirzaei2, Han Gil Na1, Sung Yong Kang1, Myung Sik Choi1, Jae Hoon Bang1, Jaegab Lee3, Inpil Kang4, Sang Sub Kim5, Hyoun Woo Kim1,2 |
1Division of Materials Science and Engineering, Hanyang University, Seoul 04763, Republic of Korea 2The Research Institute of Industrial Science, Hanyang University, Seoul 04763, Republic of Korea 3School of Advanced Materials Engineering, Kookmin University, Seoul 02707, Republic of Korea 4Department of Mechanical Design Engineering, Pukyong National University, Busan 48547, Republic of Korea 5Department of Materials Science and Engineering, Inha University, Incheon 22212, Republic of Korea |
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Received: 1 November 2016; Accepted: 19 December 2016. Published online: 4 July 2017. |
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ABSTRACT |
Pt-functionalized RGO samples were prepared and subsequently irradiated with 2-MeV electron beams (e-beams). The effect of e-beam dose on the structural, electrical, and gas sensing properties of the samples was investigated. E-beam irradiation was found to induce significant microstructural changes in the Pt-functionalized RGO. Measurements of NO2 sensing at room temperature showed that the dose of 100 kGy led to better NO2 sensing properties compared to those of unirradiated sensors. On the other hand, the dose of 500 kGy appeared to be excessive, leading to extensive damage of the RGO structure and a significant reduction in the response to NO2 gas. E-beam irradiation can be beneficial for improving the gas sensing of Pt-functionalized RGO, but its dose needs to be optimized to obtain the best sensing properties. |
Keywords:
reduced graphene oxide, gas sensor, E-Beam irradiation, Pt nanoparticles, NO2. |
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