Abstract
Conductive atomic force microscopy (C-AFM) is one of the most commonly used characterization techniques for piezoelectric one-dimensional nanomaterials. However, a comprehensive understanding of the effects of certain scan parameters on the C-AFM signals remains elusive. In the present work, the dependency of C-AFM signals on the normal force, scan speed,..... More

Abstract
We grew ZnO nanorods (NRs) using a hydrothermal method while rotating the precursor solution, and report the effect of rotation on surface modification, and the optical and ultraviolet (UV) photoresponse properties of the resulting ZnO nanorods. The ZnO NRs grown in the rotating precursor solution at 100 rpm had the..... More

Abstract
In this study, zinc oxide (ZnO) nanostructures were grown on a ZnO-buffered fluorine-doped tin oxide (FTO) substrate using a microwave chemical bath deposition method with different zinc oxide precursor concentrations from 0.01 to 0.5 M. We investigated the effects of the zinc oxide precursor concentration on the morphological, structural, optical..... More