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Dependency of Conductive Atomic Force Microscopy and Lateral Force Microscopy Signals on Scan Parameters for Zinc Oxide Nanorods
Yijun Yang, Kwanlae Kim
Korean J. Met. Mater. 2022;60(2):149-159.   Published online 2022 Jan 12
DOI: https://doi.org/10.3365/KJMM.2022.60.2.149

Abstract
Conductive atomic force microscopy (C-AFM) is one of the most commonly used characterization techniques for piezoelectric one-dimensional nanomaterials. However, a comprehensive understanding of the effects of certain scan parameters on the C-AFM signals remains elusive. In the present work, the dependency of C-AFM signals on the normal force, scan speed,..... More

                        
Size Dependency of a ZnO Nanorod-Based Piezoelectric Nanogenerator Evaluated by Conductive Atomic Force Microscopy
전도식 원자현미경을 이용한 ZnO 나노로드 기반 압전 나노발전기의 사이즈 의존성 평가
Yijun Yang, Kwanlae Kim
양이준, 김관래
Korean J. Met. Mater. 2020;58(1):67-75.   Published online 2020 Jan 1
DOI: https://doi.org/10.3365/KJMM.2020.58.1.67

Abstract
ZnO nanorods are one of the most studied materials because it can be facilely grown on a wide range of substrates at low temperature. ZnO exhibits piezoelectricity as well as semiconducting properties, and hence is applicable to piezoelectric nanogenerators and sensors. In the present work, the effect of ZnO nanorods’..... More

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